[ACM Press the 2015 International Symposium - Baltimore, MD, USA (2015.07.13-2015.07.17)] Proceedings of the 2015 International Symposium on Software Testing and Analysis - ISSTA 2015 - Feedback-controlled random test generation
Yatoh, Kohsuke, Sakamoto, Kazunori, Ishikawa, Fuyuki, Honiden, ShinichiYear:
2015
Language:
english
DOI:
10.1145/2771783.2771805
File:
PDF, 510 KB
english, 2015