Noninvasive CMOS circuit testing with NbN superconducting...

Electronics Letters 2003 Vol. 39; Iss. 14

Noninvasive CMOS circuit testing with NbN superconducting single-photon detectors

Zhang, J., Boiadjieva, N., Chulkova, G., Deslandes, H., Gol'tsman, G.N., Korneev, A., Kouminov, P., Leibowitz, M., Lo, W., Malinsky, R., Okunev, O., Pearlman, A., Slysz, W., Smirnov, K., Tsao, C., Ver
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Volume:
39
Year:
2003
Language:
english
Journal:
Electronics Letters
DOI:
10.1049/el:20030710
File:
PDF, 86 KB
english, 2003
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