[IEEE Comput. Soc IEEE 2001 2nd International Symposium on Quality Electronic Design. IEEE ISQED 2001 - San Jose, CA, USA (26-28 March 2001)] Proceedings of the IEEE 2001. 2nd International Symposium on Quality Electronic Design - Compact layout rule extraction for latchup prevention in a 0.25-μm shallow-trench-isolation silicided bulk CMOS process
Ming-Dou Ker,, Wen-Yu Lo,, Tung-Yang Chen,, Tang, H., Chen, S.-S., Wang, M.-C.Year:
2001
Language:
english
DOI:
10.1109/ISQED.2001.915241
File:
PDF, 586 KB
english, 2001