In situ reflectance difference spectroscopy of II–VI...

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In situ reflectance difference spectroscopy of II–VI compounds: A real time study of N plasma doping during molecular beam epitaxy

D. Stifter, M. Schmid, K. Hingerl, A. Bonanni, M. Garcia-rocha, H. Sitter
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Year:
1999
Language:
english
DOI:
10.1116/1.590811
File:
PDF, 455 KB
english, 1999
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