[ACM Press the 1999 ACM SIGMETRICS international conference - Atlanta, Georgia, United States (1999.05.01-1999.05.04)] Proceedings of the 1999 ACM SIGMETRICS international conference on Measurement and modeling of computer systems - SIGMETRICS '99 - On the use of trace sampling for architectural studies of desktop applications
Crowley, Patrick, Baer, Jean-LoupYear:
1999
Language:
english
DOI:
10.1145/301453.301573
File:
PDF, 256 KB
english, 1999