[ACM Press the 1999 ACM SIGMETRICS international conference...

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[ACM Press the 1999 ACM SIGMETRICS international conference - Atlanta, Georgia, United States (1999.05.01-1999.05.04)] Proceedings of the 1999 ACM SIGMETRICS international conference on Measurement and modeling of computer systems - SIGMETRICS '99 - On the use of trace sampling for architectural studies of desktop applications

Crowley, Patrick, Baer, Jean-Loup
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Year:
1999
Language:
english
DOI:
10.1145/301453.301573
File:
PDF, 256 KB
english, 1999
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