Micromorphology characterization of copper thin films by AFM and fractal analysis
Arman, Ali, Ţălu, Ştefan, Luna, Carlos, Ahmadpourian, Azin, Naseri, Mosayeb, Molamohammadi, MehrdadVolume:
26
Language:
english
Journal:
Journal of Materials Science: Materials in Electronics
DOI:
10.1007/s10854-015-3628-5
Date:
December, 2015
File:
PDF, 3.36 MB
english, 2015