Applying empirical mode decomposition (EMD) and entropy to diagnose circuit breaker faults
Mingliang, Liu, Keqi, Wang, Laijun, Sun, Jianju, ZhenLanguage:
english
Journal:
Optik - International Journal for Light and Electron Optics
DOI:
10.1016/j.ijleo.2015.05.145
Date:
July, 2015
File:
PDF, 623 KB
english, 2015