Ion microprobe mass spectrometry using sputtering atomization and resonance ionization
Donohue, David L., Christie, W. H., Goeringe, D. E., McKown, H. S.Volume:
57
Language:
english
Journal:
Analytical Chemistry
DOI:
10.1021/ac00284a007
Date:
June, 1985
File:
PDF, 606 KB
english, 1985