Current-accelerated channel hot carrier stress of MOS...

Electronics Letters 1998 Vol. 34; Iss. 2

Current-accelerated channel hot carrier stress of MOS transistors

Sah, Chih-Tang, Neugroschel, A., Han, K.M.
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Volume:
34
Year:
1998
Language:
english
Journal:
Electronics Letters
DOI:
10.1049/el:19980194
File:
PDF, 177 KB
english, 1998
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