Bismuth nano-Hall probes fabricated by focused ion beam milling for direct magnetic imaging by room temperature scanning Hall probe microscopy
Sandhu, A., Masuda, H., Kurosawa, K., Oral, A., Bending, S.J.Volume:
37
Year:
2001
Language:
english
Journal:
Electronics Letters
DOI:
10.1049/el:20010908
File:
PDF, 1009 KB
english, 2001