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AIP Conference Proceedings [AIP INTERNATIONAL CONFERENCE ON ADVANCES IN MATERIALS AND PROCESSING TECHNOLOGIES (AMPT2010) - Paris, (France) (24–27 October 2010)] - Study on ultra-fine w-EDM with on-machine measurement-assisted
Chen, Shun-Tong, Yang, Hong-Ye, Chinesta, Francisco, Chastel, Yvan, El Mansori, MohamedYear:
2011
Language:
english
DOI:
10.1063/1.3552355
File:
PDF, 1.46 MB
english, 2011