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Micro-structural characterization of low resistive metallic Ni germanide growth on annealing of Ni-Ge multilayer
Swain, Mitali, Singh, Surendra, Bhattacharya, Debarati, Singh, Ajay, Tokas, R.B., Prajapat, C. L., Basu, SaibalVolume:
5
Language:
english
Journal:
AIP Advances
DOI:
10.1063/1.4926843
Date:
July, 2015
File:
PDF, 2.37 MB
english, 2015