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X-ray-photoemission-spectroscopy evidence for anomalous oxidation states of silicon after exposure of hydrogen-terminated single-crystalline (100) silicon to a diluted N2 : N2O atmosphere
Cerofolini, G F, Galati, C, Renna, L, Viscuso, O, Camalleri, M, Lorenti, S, Condorelli, G G, Fragalà, I LVolume:
35
Language:
english
Journal:
Journal of Physics D: Applied Physics
DOI:
10.1088/0022-3727/35/10/311
Date:
May, 2002
File:
PDF, 351 KB
english, 2002