[IEEE 2015 73rd Annual Device Research Conference (DRC) -...

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[IEEE 2015 73rd Annual Device Research Conference (DRC) - Columbus, OH, USA (2015.6.21-2015.6.24)] 2015 73rd Annual Device Research Conference (DRC) - Full front and back gate voltage range method for the parameter extraction of advanced FDSOI CMOS devices

Karatsori, T. A., Theodorou, C. G., Ioannidis, E. G., Haendler, S., Josse, E., Dimitriadis, C. A., Ghibaudo, G.
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Year:
2015
Language:
english
DOI:
10.1109/DRC.2015.7175582
File:
PDF, 978 KB
english, 2015
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