[IEEE 2015 IEEE 65th Electronic Components and Technology Conference (ECTC) - San Diego, CA, USA (2015.5.26-2015.5.29)] 2015 IEEE 65th Electronic Components and Technology Conference (ECTC) - Noise coupling emulation between TSV and active circuit through metal oxide patch
Lee, Manho, Cho, Jonghyun, Lim, Jaemin, Kim, JounghoYear:
2015
Language:
english
DOI:
10.1109/ECTC.2015.7159867
File:
PDF, 896 KB
english, 2015