[IEEE 2015 IEEE 65th Electronic Components and Technology...

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[IEEE 2015 IEEE 65th Electronic Components and Technology Conference (ECTC) - San Diego, CA, USA (2015.5.26-2015.5.29)] 2015 IEEE 65th Electronic Components and Technology Conference (ECTC) - Noise coupling emulation between TSV and active circuit through metal oxide patch

Lee, Manho, Cho, Jonghyun, Lim, Jaemin, Kim, Joungho
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Year:
2015
Language:
english
DOI:
10.1109/ECTC.2015.7159867
File:
PDF, 896 KB
english, 2015
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