[IEEE 2015 16th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) - Erlagol, Russia (2015.6.29-2015.7.3)] 2015 16th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices - Quantization noise influence on mobility spectrum method
Trifanov, Alexandr V., Protasov, Dmitry D., Kostuchenko, Vladimir Ya.Year:
2015
Language:
english
DOI:
10.1109/EDM.2015.7184492
File:
PDF, 549 KB
english, 2015