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[IEEE 2015 IEEE 27th International Symposium on Power Semiconductor Devices & IC's (ISPSD) - Hong Kong, China (2015.5.10-2015.5.14)] 2015 IEEE 27th International Symposium on Power Semiconductor Devices & IC's (ISPSD) - Short-circuit failure mechanism of SiC power MOSFETs
Romano, G., Maresca, L., Riccio, M., d'Alessandro, V., Breglio, G., Irace, A., Fayyaz, A., Castellazzi, A.Year:
2015
Language:
english
DOI:
10.1109/ISPSD.2015.7123460
File:
PDF, 675 KB
english, 2015