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[IEEE 2015 14th IAPR International Conference on Machine Vision Applications (MVA) - Tokyo, Japan (2015.5.18-2015.5.22)] 2015 14th IAPR International Conference on Machine Vision Applications (MVA) - Surface defect detection in low-contrast images using basis image representation
Tsai, Du-Ming, Tseng, Yan-Hsin, Chiu, Wei-YaoYear:
2015
Language:
english
DOI:
10.1109/MVA.2015.7153163
File:
PDF, 559 KB
english, 2015