Scanning tunneling microscopy of defects in NbSe[sub 2]
A. Prodan, V. Marinković, R. Gril, N. Ramšak, H. J. P. Van Midden, F. W. Boswell, J. C. BennettYear:
2000
Language:
english
DOI:
10.1116/1.591151
File:
PDF, 1.00 MB
english, 2000