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SPIE Proceedings [SPIE SPIE Sensing Technology + Applications - Baltimore, Maryland, United States (Monday 20 April 2015)] Next-Generation Spectroscopic Technologies VIII - Filter selection criteria for the discrimination of strongly overlapping chemical spectra
Druy, Mark A., Crocombe, Richard A., Bannon, David P., Major, Kevin J., Poutous, Menelaos K., Dunnill, Kevin F., Ewing, Kenneth J., Sanghera, Jasbinder S., Aggarwal, Ishwar D.Volume:
9482
Year:
2015
Language:
english
DOI:
10.1117/12.2176623
File:
PDF, 915 KB
english, 2015