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SPIE Proceedings [SPIE SPIE Sensing Technology + Applications - Baltimore, Maryland, United States (Monday 20 April 2015)] Next-Generation Spectroscopic Technologies VIII - Characterization of ion-assisted induced absorption in A-Si thin-films used for multivariate optical computing
Druy, Mark A., Crocombe, Richard A., Bannon, David P., Nayak, Aditya B., Price, James M., Dai, Bin, Perkins, David, Chen, Ding Ding, Jones, Christopher M.Volume:
9482
Year:
2015
Language:
english
DOI:
10.1117/12.2177125
File:
PDF, 808 KB
english, 2015