SPIE Proceedings [SPIE 1988 Intl Congress on Optical Science and Engineering - Hamburg, Germany (Monday 19 September 1988)] Surface Measurement and Characterization - Comparison Of Light Scattering From Rough Surfaces With Optical And Mechanical Profilometry
Brodmann, R., Allgauer, M., Bennett, Jean M.Volume:
1009
Year:
1989
Language:
english
DOI:
10.1117/12.949161
File:
PDF, 6.92 MB
english, 1989