A Comparative High-Resolution Electron Microscope Study of...

Japanese Journal of Applied Physics 1994 / 3 Vol. 33; Iss. Part 1, No

A Comparative High-Resolution Electron Microscope Study of Ag Clusters Produced by a Sputter-Gas Aggregation and Ion Cluster Beam Technique

Hohl, Georg-Friedrich, Hihara, Takehiko, Sakurai, Masaki, Oishi, Takashi, Wakoh, Kimio, Sumiyama, Kenji, Suzuki, Kenji
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Volume:
33
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.33.1509
Date:
March, 1994
File:
PDF, 126 KB
english, 1994
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