Dynamic Force Microscopy Investigations of C60 Deposited on...

Japanese Journal of Applied Physics 1999 / 12 Vol. 38; Iss. Part 2, No

Dynamic Force Microscopy Investigations of C60 Deposited on Si(111) Surface

Kobayashi, Kei, Yamada, Hirofumi, Horiuchi, Toshihisa, Matsushige, Kazumi
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
38
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.38.L1550
Date:
December, 1999
File:
PDF, 252 KB
english, 1999
Conversion to is in progress
Conversion to is failed