Nonlinear Phase Imaging Using Two-Beam Interferometry in...

Japanese Journal of Applied Physics 2009 / 6 Vol. 48; Iss. 6

Nonlinear Phase Imaging Using Two-Beam Interferometry in Stimulated Parametric Emission Microscopy

Yamagiwa, Masatomo, Ozeki, Yasuyuki, Omura, Gen, Suzuki, Takeshi, Kajiyama, Shin'ichiro, Fukui, Kiichi, Itoh, Kazuyoshi
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Volume:
48
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.48.062501
Date:
June, 2009
File:
PDF, 248 KB
english, 2009
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