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Characterization of Ionic Impurities Adsorbed onto a 5$^{\circ}$ SiO$_{x}$ Alignment Film
Huang, Yi, Bhowmik, Achintya, Bos, Philip J.Volume:
51
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.51.031701
Date:
March, 2012
File:
PDF, 1.46 MB
english, 2012