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[ACM Press the 2006 conference - Yokohama, Japan (2006.01.24-2006.01.27)] Proceedings of the 2006 conference on Asia South Pacific design automation - ASP-DAC '06 - Statistical leakage minimization through joint selection of gate sizes, gate lengths and threshold voltage
Bhardwaj, Sarvesh, Cao, Yu, Vrudhula, SarmaYear:
2006
Language:
english
DOI:
10.1145/1118299.1118513
File:
PDF, 491 KB
english, 2006