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[ACM Press the 20th annual conference - Copacabana, Rio de Janeiro (2007.09.03-2007.09.06)] Proceedings of the 20th annual conference on Integrated circuits and systems design - SBCCI '07 - A built-in current sensor for high speed soft errors detection robust to process and temperature variations
Neto, Egas Henes, Kastensmidt, Fernanda Lima, Wirth, Gilson IncioYear:
2007
Language:
english
DOI:
10.1145/1284480.1284534
File:
PDF, 373 KB
english, 2007