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[IEEE 2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation & Test (VLSI-TSA-DAT) - Hsinchu, Taiwan (27-29 April 2005)] 2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test, 2005. (VLSI-TSA-DAT). - Delay defect coverage for FPGA test configurations based on statistical evaluation
Hsiang-Chieh Liao,, Jing-Jia Liou,, Yen-Lin Peng,, Chih-Tsun Huang,, Cheng-Wen Wu,Year:
2005
Language:
english
DOI:
10.1109/vdat.2005.1500059
File:
PDF, 615 KB
english, 2005