Structural Investigation of Si(111) $\sqrt{3}{\times}\sqrt{3}$-In by Low-Energy Ion-Scattering Spectroscopy
Izumi, Koichi, Takahashi, Toshio, Kikuta, SeishiVolume:
28
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/jjap.28.1742
Date:
October, 1989
File:
PDF, 652 KB
1989