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Analysis of Smear Noise in Interline-CCD Image Sensor with Gate-Free Isolation Structure
Ono, Hideyuki, Ozaki, Toshifumi, Tanaka, Haruhiko, Kawamoto, YoshifumiVolume:
30
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/jjap.30.3621
Date:
December, 1991
File:
PDF, 853 KB
1991