Simulation Study of Noise Influence in 3-Dimensional Reconstruction using High-Angle Hollow-Cone Dark-Field Transmission Electron Microscope Images
Tsuneta, Ruriko, Nakamura, Kuniyasu, Kakibayashi, HiroshiVolume:
36
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/jjap.36.368
Date:
January, 1997
File:
PDF, 248 KB
english, 1997