Reliability Test Guidelines for a 0.18 µm Generation...

Japanese Journal of Applied Physics 2003 / 4 Vol. 42; Iss. Part 1, No

Reliability Test Guidelines for a 0.18 µm Generation Multi-Oxide CMOS Technology for System-on-Chip Applications

Chen, Shang-Jr, Lin, Ching-Chung, Chung, Steve Shao-Shiun, Lin, Jung-Chun, Chu, Chih-Hsiun
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
42
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/jjap.42.1928
Date:
April, 2003
File:
PDF, 292 KB
english, 2003
Conversion to is in progress
Conversion to is failed