Mobility and Number Fluctuations in MOS Structures

Japanese Journal of Applied Physics 2005 / 4 Vol. 44; Iss. 4B

Mobility and Number Fluctuations in MOS Structures

Hamayoshi, Shinichi, Nakamoto, Takayuki, Wada, Masanori, Ohkura, Kensaku, Tabei, Tetsuo, Ikeda, Mitsuhisa, Higuchi, Katsuhiko
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Volume:
44
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/jjap.44.2198
Date:
April, 2005
File:
PDF, 135 KB
english, 2005
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