Comparison of Interface Characterization between Ag(In,Ga)Se$_{2}$ and Cu(In,Ga)Se$_{2}$ Solar Cells by High-Angle-Annular Dark-Field Scanning Transmission Electron Microscopy
Xianfeng, Zhang, Kobayashi, Tsuyoshi, Kurokawa, Yasuyoshi, Tashiro, Yoshiyuki, Ohtsuka, Masahiro, Yamada, Tomoyuki, Yamada, AkiraVolume:
50
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/jjap.50.126603
Date:
November, 2011
File:
PDF, 171 KB
english, 2011