[ACM Press the 2010 ACM-IEEE International Symposium - Bolzano-Bozen, Italy (2010.09.16-2010.09.17)] Proceedings of the 2010 ACM-IEEE International Symposium on Empirical Software Engineering and Measurement - ESEM '10 - An event-based empirical process analysis framework
Sunindyo, Wikan Danar, Biffl, Stefan, Mordinyi, Richard, Moser, Thomas, Schatten, Alexander, Tabatabai, Mohammed, Wahyudin, Dindin, Weippl, Edgar, Winkler, DietmarYear:
2010
Language:
english
DOI:
10.1145/1852786.1852867
File:
PDF, 189 KB
english, 2010