Using Clustering and Metric Learning to Improve Science Return of Remote Sensed Imagery
Hayden, David S., Chien, Steve, Thompson, David R., Castaño, RebeccaVolume:
3
Language:
english
Journal:
ACM Transactions on Intelligent Systems and Technology
DOI:
10.1145/2168752.2168765
Date:
May, 2012
File:
PDF, 3.82 MB
english, 2012