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[IEEE 2015 IEEE 22nd International Conference on Software Analysis, Evolution and Reengineering (SANER) - Montreal, QC, Canada (2015.3.2-2015.3.6)] 2015 IEEE 22nd International Conference on Software Analysis, Evolution, and Reengineering (SANER) - TRACERJD: Generic trace-based dynamic dependence analysis with fine-grained logging
Cai, Haipeng, Santelices, RaulYear:
2015
Language:
english
DOI:
10.1109/SANER.2015.7081862
File:
PDF, 696 KB
english, 2015