Measurement of Microwave Conductivity of Semiconductors by...

Measurement of Microwave Conductivity of Semiconductors by Eddy Current Loss Method

Watanabe, Yoshiyuki, Maeda, Ken, Saito, Shozo, Uda, Keiichiroh
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Volume:
16
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.16.2007
Date:
November, 1977
File:
PDF, 484 KB
1977
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