Measurement of Microwave Conductivity of Semiconductors by Eddy Current Loss Method
Watanabe, Yoshiyuki, Maeda, Ken, Saito, Shozo, Uda, KeiichirohVolume:
16
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.16.2007
Date:
November, 1977
File:
PDF, 484 KB
1977