Defect-Trapping by Sn Atoms Implanted in Aluminum

Japanese Journal of Applied Physics 1985 / 2 Vol. 24; Iss. Part 1, No

Defect-Trapping by Sn Atoms Implanted in Aluminum

Yagi, Eiichi, Koyama, Akio, Nakamura, Shiho, Sakairi, Hideo, Hasiguti, Ryukiti R.
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Volume:
24
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.24.137
Date:
February, 1985
File:
PDF, 196 KB
english, 1985
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