Nature of Deep-Level Defects in GaCrN Diluted Magnetic Semiconductor
Subashchandran, Shanthi, Kimura, Shigeya, Kim, Moo Seong, Kobayashi, Satoru, Zhou, Yi Kai, Hasegawa, Shigehiko, Asahi, HajimeVolume:
45
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.45.3522
Date:
April, 2006
File:
PDF, 291 KB
2006