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[ACM Press the 42nd annual conference - San Diego, California, USA (2005.06.13-2005.06.17)] Proceedings of the 42nd annual conference on Design automation - DAC '05 - Automatic scenario detection for improved WCET estimation

Gheorghita, Stefan Valentin, Stuijk, Sander, Basten, Twan, Corporaal, Henk
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Year:
2005
Language:
english
DOI:
10.1145/1065579.1065610
File:
PDF, 920 KB
english, 2005
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