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[IEEE 2015 19th International Symposium on VLSI Design and Test (VDAT) - Ahmedabad, India (2015.6.26-2015.6.29)] 2015 19th International Symposium on VLSI Design and Test - Detection and analysis of hardware trojan using scan chain method
Rithesh, M, Harish, G, Ram, B V Bhargav, Yellampalli, SivaYear:
2015
Language:
english
DOI:
10.1109/ISVDAT.2015.7208124
File:
PDF, 1.19 MB
english, 2015