Studies on Chemically Etched Silicon, Gallium Arsenide, and Gallium Phosphide Surfaces by Auger Electron Spectroscopy
Oda, Tetsuji, Sugano, TakuoVolume:
15
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.15.1317
Date:
July, 1976
File:
PDF, 183 KB
english, 1976