Cross Sectional Transmission Electron Microscopy of Zn...

Japanese Journal of Applied Physics 1985 / 8 Vol. 24; Iss. Part 2, No

Cross Sectional Transmission Electron Microscopy of Zn Diffusion Induced Disordering of GaAlAs-GaAs Multiquantum-Well Structures

Ishida, Koichi, Ohta, Tsuneaki, Semura, Shigeru, Nakashima, Hisao
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Volume:
24
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.24.L620
Date:
August, 1985
File:
PDF, 1.01 MB
1985
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