Measurement of Laser Damage Threshold of 355-nm Antireflection Coating
Tamura, Shigeharu, Kimura, Saburo, Sato, Yoshiyuki, Otani, Minoru, Yoshida, Hidetsugu, Yoshida, KunioVolume:
28
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.28.1141
Date:
June, 1989
File:
PDF, 326 KB
1989