Measurement of Laser Damage Threshold of 355-nm...

Measurement of Laser Damage Threshold of 355-nm Antireflection Coating

Tamura, Shigeharu, Kimura, Saburo, Sato, Yoshiyuki, Otani, Minoru, Yoshida, Hidetsugu, Yoshida, Kunio
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Volume:
28
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.28.1141
Date:
June, 1989
File:
PDF, 326 KB
1989
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