Scanning Internal-Photoemission Microscopy: New Mapping...

Japanese Journal of Applied Physics 1989 / 7 Vol. 28; Iss. Part 2, No

Scanning Internal-Photoemission Microscopy: New Mapping Technique to Characterize Electrical Inhomogeneity of Metal-Semiconductor Interface

Okumura, Tsugunori, Shiojima, Kenji
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Volume:
28
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.28.L1108
Date:
July, 1989
File:
PDF, 314 KB
english, 1989
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