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Low Temperature Poly-Si TFTs Using Solid Phase Crystallization of Very Thin Films and an Electron Cyclotron Resonance Chemical Vapor Deposition Gate Insulator
Little, Thomas W., Takahara, Ken-ichi, Koike, Hideki, Nakazawa, Takashi, Yudasaka, Ichio, Ohshima, HiroyukiVolume:
30
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.30.3724
Date:
December, 1991
File:
PDF, 194 KB
english, 1991