Relationship between Electrical Conductivity and Charged- Dangling-Bond Density in Nitrogen- and Phosphorus-Doped Hydrogenated Amorphous Silicon
Masuda, Atsushi, Itoh, Ken-ichi, Zhou, Jiang-Huai, Kumeda, Minoru, Shimizu, TatsuoVolume:
33
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.33.L1295
Date:
September, 1994
File:
PDF, 426 KB
1994