Potentiometry Combined with Atomic Force Microscope

Japanese Journal of Applied Physics 1994 / 11 Vol. 33; Iss. Part 2, No

Potentiometry Combined with Atomic Force Microscope

Uchihashi, Takayuki, Fukano, Yoshinobu, Sugawara, Yasuhiro, Morita, Seizo, Nakano, Akihiko, Ida, Tohru, Okada, Takao
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Volume:
33
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.33.L1562
Date:
November, 1994
File:
PDF, 762 KB
1994
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